We’re looking forward to the NDIA T&AC meeting this Thursday, April 9, 2026, where Dr. Jonathan Graf will be presenting “Independent Sources of Truth for Evidence-Based Microelectronics Assurance.”
This talk explores how microelectronics assurance depends on creating, preserving, and evaluating independent sources of truth. Dr. Graf will highlight real-world applications of securing FPGA designs using evidence generated by Enverité FPGA assurance software.